Counterfeit Detection by Extracting Rules from Product Traces

Authors: Wang L., Oertel N., Müller E., Seidl T.
Published in: Proc. 12th IASTED International Conference on Intelligent Systems and Control (ISC 2009), Cambridge, USA
Sprache: EN
Jahr: 2009
Konferenz: IASTED ISC
URL:IASTED ISC 2009
Typ: Tagungsbeiträge
Forschungsgebiet: