Publikationen
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2009
Wang L., Oertel N., Müller E., Seidl T.:
Counterfeit Detection by Extracting Rules from Product Traces
Proc. 12th IASTED International Conference on Intelligent Systems and Control (ISC 2009), Cambridge, USA (2009)
[IASTED ISC 2009]
Counterfeit Detection by Extracting Rules from Product Traces
Proc. 12th IASTED International Conference on Intelligent Systems and Control (ISC 2009), Cambridge, USA (2009)
[IASTED ISC 2009]
