Counterfeit Detection by Extracting Rules from Product Traces

Authors: Wang L., Oertel N., Müller E., Seidl T.
Published in: Proc. 12th IASTED International Conference on Intelligent Systems and Control (ISC 2009), Cambridge, USA
Language: EN
Year: 2009
Conference: IASTED ISC
Url:IASTED ISC 2009
Type: Conference papers (peer reviewed)
Research topic: