Counterfeit Detection by Extracting Rules from Product Traces
| Authors: | Wang L., Oertel N., Müller E., Seidl T. |
| Published in: | Proc. 12th IASTED International Conference on Intelligent Systems and Control (ISC 2009), Cambridge, USA |
| Language: | EN |
| Year: | 2009 |
| Conference: | IASTED ISC |
| Url: | IASTED ISC 2009 |
| Type: | Conference papers (peer reviewed) |
| Research topic: |
