Detecting and Exploring Clusters in Attributed Graphs

Authors: Boden B., Haag R., Seidl T.
Published in: Proceedings of the 22nd ACM Conference on Information and Knowledge Management (CIKM 2013), San Francisco, CA, USA
Publisher: ACM
Language: EN
Year: 2013


Pages: 2505-2508
Conference: CIKM
Url:CIKM 2013
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Type: Conference papers (peer reviewed)
Research topic: Data Analysis and Knowledge Extraction